发明名称 |
APPARATUS FOR MEASURING WARPAGE CHARACTERISTIC OF SPECIMEN |
摘要 |
There is provided an apparatus for measuring a warpage characteristic of a specimen, the apparatus including: a light irradiating unit irradiating light toward the specimen; alight transmitting member transmitting the light irradiated by the light irradiating unit therethrough and including a reference lattice pattern to allow a shadow to be formed on the specimen; a sensing unit sensing the shadow formed on the specimen by the reference lattice pattern; and a heating plate disposed under the light transmitting member and heating the specimen mounted thereon, wherein the reference lattice pattern formed on the light transmitting member is formed of a conductive material and is connected to a power supplying unit to thereby generate heat when power is supplied.
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申请公布号 |
US2013100460(A1) |
申请公布日期 |
2013.04.25 |
申请号 |
US201213411286 |
申请日期 |
2012.03.02 |
申请人 |
WOO SEUNG WAN;HAM SUK JIN;JI KUM YOUNG;NA CHAE HYUN;LEE CHANG YUN;SAMSUNG ELECTRO-MECHANICS CO.,LTD. |
发明人 |
WOO SEUNG WAN;HAM SUK JIN;JI KUM YOUNG;NA CHAE HYUN;LEE CHANG YUN |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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