发明名称 MOSFETs with Multiple Dislocation Planes
摘要 A method includes forming a metal-oxide-semiconductor field-effect transistor (MOSFET), which includes forming a first dislocation plane adjacent to a gate electrode of the MOSFET, and forming a second dislocation plane adjacent to the gate electrode of the MOSFET. The first and the second dislocation planes are on a same side of the gate electrode, and extend into source/drain regions of the MOSFET.
申请公布号 US2013099294(A1) 申请公布日期 2013.04.25
申请号 US201113280094 申请日期 2011.10.24
申请人 LU WEI-YUAN;HUANG LI-PING;TSAI HAN-TING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LU WEI-YUAN;HUANG LI-PING;TSAI HAN-TING
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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