发明名称 |
MOSFETs with Multiple Dislocation Planes |
摘要 |
A method includes forming a metal-oxide-semiconductor field-effect transistor (MOSFET), which includes forming a first dislocation plane adjacent to a gate electrode of the MOSFET, and forming a second dislocation plane adjacent to the gate electrode of the MOSFET. The first and the second dislocation planes are on a same side of the gate electrode, and extend into source/drain regions of the MOSFET. |
申请公布号 |
US2013099294(A1) |
申请公布日期 |
2013.04.25 |
申请号 |
US201113280094 |
申请日期 |
2011.10.24 |
申请人 |
LU WEI-YUAN;HUANG LI-PING;TSAI HAN-TING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
LU WEI-YUAN;HUANG LI-PING;TSAI HAN-TING |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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