发明名称 Method of producing a semiconductor device comprising a through-substrate via and a capping layer and corresponding semiconductor device
摘要 <p>The method of producing a semiconductor device comprises the steps of providing a semiconductor substrate (1) with an electrically conductive structure (11), forming a hole (4) through the substrate in a direction normal to its main surface (10), and forming a through-substrate via (5) in the hole by introducing an electrically conductive material without filling the hole. A capping layer (6) is applied above the main surface in such a way that the capping layer closes the remaining inner volume (14) of the through-substrate via without filling the hole or at least partially covers an annular cavity surrounding the through-substrate via. The capping layer is structured, so that the electrically conductive structure is not completely covered by the capping layer.</p>
申请公布号 EP2584598(A1) 申请公布日期 2013.04.24
申请号 EP20110185999 申请日期 2011.10.20
申请人 AUSTRIAMICROSYSTEMS AG 发明人 SCHRANK, FRANZ;CASSIDY, CATHAL
分类号 H01L21/768;H01L23/48;H01L25/065 主分类号 H01L21/768
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