发明名称 |
Method of producing a semiconductor device comprising a through-substrate via and a capping layer and corresponding semiconductor device |
摘要 |
<p>The method of producing a semiconductor device comprises the steps of providing a semiconductor substrate (1) with an electrically conductive structure (11), forming a hole (4) through the substrate in a direction normal to its main surface (10), and forming a through-substrate via (5) in the hole by introducing an electrically conductive material without filling the hole. A capping layer (6) is applied above the main surface in such a way that the capping layer closes the remaining inner volume (14) of the through-substrate via without filling the hole or at least partially covers an annular cavity surrounding the through-substrate via. The capping layer is structured, so that the electrically conductive structure is not completely covered by the capping layer.</p> |
申请公布号 |
EP2584598(A1) |
申请公布日期 |
2013.04.24 |
申请号 |
EP20110185999 |
申请日期 |
2011.10.20 |
申请人 |
AUSTRIAMICROSYSTEMS AG |
发明人 |
SCHRANK, FRANZ;CASSIDY, CATHAL |
分类号 |
H01L21/768;H01L23/48;H01L25/065 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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