发明名称 Nonvolatile memory device and manufacturing method thereof
摘要 There are provided a resistance variable nonvolatile memory device which changes its resistance stably at low voltages and is suitable for a miniaturized configuration, and a manufacturing method thereof. The nonvolatile memory device comprises: a substrate (100); a first electrode (101); an interlayer insulating layer (102); a memory cell hole (103) formed in the interlayer insulating layer; a first resistance variable layer (104a) formed in at least a bottom portion of the memory cell hole and connected to the first electrode; a second resistance variable layer (104b) formed inside the memory cell hole (103) and located on the first resistance variable layer (104a); and a second electrode (105); the first resistance variable layer (104a) and the second resistance variable layer (104b) respectively comprising metal oxides of the same kind; and the first resistance variable layer (104a) having a higher oxygen content than the second resistance variable layer (104b).
申请公布号 US8426836(B2) 申请公布日期 2013.04.23
申请号 US200913132544 申请日期 2009.06.30
申请人 MIKAWA TAKUMI;KAWASHIMA YOSHIO;HIMENO ATSUSHI;PANASONIC CORPORATION 发明人 MIKAWA TAKUMI;KAWASHIMA YOSHIO;HIMENO ATSUSHI
分类号 H01L29/02 主分类号 H01L29/02
代理机构 代理人
主权项
地址