| 发明名称 |
Inspecting device including detachable probe |
| 摘要 |
An inspecting device including a detachable probe has a link structure, and thus a subject having various diameters is tested. In addition, since various probes are changeably used in a scanner housing, ultrasonic wave testing and eddy current testing are simultaneously performed. |
| 申请公布号 |
US8424385(B2) |
申请公布日期 |
2013.04.23 |
| 申请号 |
US20090575650 |
申请日期 |
2009.10.08 |
| 申请人 |
PARK MINSU;WOO JANGMYONG;KIM GYUNGSUB;CHOI SANGHOON;KOREA PLANT SERVICE & ENGINEERING CO., LTD |
发明人 |
PARK MINSU;WOO JANGMYONG;KIM GYUNGSUB;CHOI SANGHOON |
| 分类号 |
G01N29/24;G01N29/265 |
主分类号 |
G01N29/24 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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