发明名称 Semiconductor devices having field effect transistors with epitaxial patterns in recessed regions
摘要 A semiconductor device includes a device isolation pattern, a gate line, and an epitaxial pattern. The device isolation pattern is disposed in a semiconductor substrate to define an active area. The gate line intersects the active area. The epitaxial pattern fills a recess region in the active area at one side of the gate line and includes a different constituent semiconductor element than the semiconductor substrate. The recess region includes a first inner sidewall that is adjacent to the device isolation pattern and extends in the lengthwise direction of the gate, and a second inner sidewall that extends in the direction perpendicular to the lengthwise direction of the gate line. The active area forms the first inner sidewall of the recess, while the device isolation layer forms at least a portion of the second inner sidewall of the recess. The epitaxial pattern contacts the first inner sidewall and the second inner sidewall of the recess region.
申请公布号 US8426926(B2) 申请公布日期 2013.04.23
申请号 US201113078159 申请日期 2011.04.01
申请人 SHIN DONGSUK;KIM DONG HYUK;KIM MYUNGSUN;LEE YONGJOO;CHUNG HOI SUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN DONGSUK;KIM DONG HYUK;KIM MYUNGSUN;LEE YONGJOO;CHUNG HOI SUNG
分类号 H01L29/76;H01L29/00;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
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