发明名称 APPARATUS AND METHOD FOR REMOVING PATICLES OF SEMICONDUCTOR CHIP
摘要 PURPOSE: An apparatus and a method for removing particles of a semiconductor chip are provided to remove the particles by using an adhesive tape and to prevent the damage of the semiconductor chip. CONSTITUTION: A supply unit(200) supplies an adhesive tape(100) to the upper surface of a semiconductor chip(11). The supply unit includes a release roller(220) for winding the adhesive tape and a traction roller(210) for pulling the adhesive tape. A pressurization unit(300) attaches the adhesive tape on the surface of the semiconductor chip. The pressurization unit includes a pressure roller(310) and a pressure roller driver(320) for moving the pressure roller along the surface of the semiconductor chip. A transfer unit(400) moves the adhesive tape on the semiconductor chip.
申请公布号 KR20130040005(A) 申请公布日期 2013.04.23
申请号 KR20110104724 申请日期 2011.10.13
申请人 HYUNDAI CALIBRATION & CERTIFICATION TECHNOLOGIES CO., LTD. 发明人 KWON, YONG TAEK;AHN, KANG HO;CHOI, JEONG SEOK;AN, JIN HONG
分类号 H01L21/02;H01L21/302 主分类号 H01L21/02
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