发明名称 PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a reflective mask blank, a mask for reflection exposure or a reticle enabling accurate exposure transfer while preventing reflection of light from the region other than a circuit pattern region to be exposed. <P>SOLUTION: A reflective mask blank having a sacrificial film formed partially on the upper side of a substrate, and a multilayer reflection film, a protective film, an absorption film and a back conductive film formed on the substrate is prepared. Subsequently, a circuit pattern and a light-shielding frame region are formed by removing the absorption film of the circuit pattern and the region other than that region selectively. Then, the protective film, the multilayer reflection film and the sacrificial film are removed in two stages of dry etching and wet etching. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074194(A) 申请公布日期 2013.04.22
申请号 JP20110213242 申请日期 2011.09.28
申请人 TOPPAN PRINTING CO LTD 发明人 WATANABE GENTA;SAKATA AKIRA
分类号 H01L21/027;G03F1/22 主分类号 H01L21/027
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