发明名称 ADHESIVE TAPE FOR PROCESSING BRITTLE WAFER AND PROCESSING METHOD OF BRITTLE WAFER USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide an adhesive tape for processing a brittle wafer that is bonded to the wafer surface in order to protect the luminous layer and the circuit surface so that the rear surface of the wafer can be ground up to a predetermined finish thickness with no problem and jumping of chips is prevented at the time of breaking, in the process of grinding and processing the rear surface of the brittle wafer, and to provide a processing method of a brittle wafer using the same. <P>SOLUTION: The adhesive tape for processing a brittle wafer has, on a base material resin film, an adhesive layer consisting of at least one layer composed of radiation-curable adhesive and at least one layer composed of a pressure-sensitive adhesive, in order from the base material resin film. Adhesive force of the adhesive layer to the silicon wafer mirror surface is 2.0-15 N/25 mm, compression displacement before radiation-curing is 150 &mu;m or less, and the thickness of the base material resin film is 25-150 &mu;m. A processing method of a brittle wafer using the adhesive tape for processing the brittle wafer is also provided. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074200(A) 申请公布日期 2013.04.22
申请号 JP20110213346 申请日期 2011.09.28
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 YOSHIMOTO SHOTA;OKA YOSHIFUMI;UCHIYAMA TOMORO;OKAMOTO KAZUYUKI;HATTORI SATOSHI
分类号 H01L21/304;H01L21/301 主分类号 H01L21/304
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