发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To solve a problem that an ion implanted in a gate electrode film reaches a channel region to affect electrical characteristics of an MISFET. <P>SOLUTION: A field effect transistor comprises a first gate electrode film formed on a principal surface of a semiconductor substrate via a gate insulation film and consisting primarily of silicon containing an impurity to be a first conductivity type; an intermediate layer formed on the first gate electrode film and consisting primarily of silicon containing one or both of oxygen and nitrogen; and a second gate electrode film formed on the first gate electrode film via the intermediate layer and consisting primarily of silicon containing the impurity to be the first conductivity type. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013074189(A) |
申请公布日期 |
2013.04.22 |
申请号 |
JP20110213120 |
申请日期 |
2011.09.28 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
FUKUSHIMA YOICHI;NISHISAKA MIKA |
分类号 |
H01L21/336;H01L21/28;H01L21/8238;H01L21/8242;H01L27/092;H01L27/108;H01L29/423;H01L29/49;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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