发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem that an ion implanted in a gate electrode film reaches a channel region to affect electrical characteristics of an MISFET. <P>SOLUTION: A field effect transistor comprises a first gate electrode film formed on a principal surface of a semiconductor substrate via a gate insulation film and consisting primarily of silicon containing an impurity to be a first conductivity type; an intermediate layer formed on the first gate electrode film and consisting primarily of silicon containing one or both of oxygen and nitrogen; and a second gate electrode film formed on the first gate electrode film via the intermediate layer and consisting primarily of silicon containing the impurity to be the first conductivity type. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074189(A) 申请公布日期 2013.04.22
申请号 JP20110213120 申请日期 2011.09.28
申请人 ELPIDA MEMORY INC 发明人 FUKUSHIMA YOICHI;NISHISAKA MIKA
分类号 H01L21/336;H01L21/28;H01L21/8238;H01L21/8242;H01L27/092;H01L27/108;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/336
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