发明名称 |
METHOD FOR ADJUSTING EXPOSURE DEVICE, SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for adjusting an exposure device in which adjustment is possible with high accuracy. <P>SOLUTION: A method for adjusting an exposure device includes the steps of: irradiating a mirror surface part of an exposure device having a mirror surface member having a light scattering portion on the mirror surface part with laser beams; calculating distance up to the light scattering portion based on scattering light of laser beams from the light scattering portion of the mirror surface part; determining a shape of the mirror surface based on a calculation step; and adjusting the shape of the mirror surface part based on the determination result. According to such a method, shape recognition of the mirror surface is made possible by light scattering even in the mirror surface part, and the parallelization degree of exposure light can be effectively corrected by adjusting a surface shape of the mirror surface part based on such a method. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013073211(A) |
申请公布日期 |
2013.04.22 |
申请号 |
JP20110214469 |
申请日期 |
2011.09.29 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
AKIBA YUJI;SASAZAWA HIDEAKI |
分类号 |
G03F7/20;G01B11/00;G01B11/24;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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