发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to protect a Ti layer using a SiN layer with excellent wet-proof properties and to prevent the corrosion of the Ti layer due to impurities. CONSTITUTION: A lower line layer(2) is formed on a GaAs substrate(1). A resin layer(4) is formed on the GaAs substrate and the lower line layer. A SiN layer(6) is formed on the lower line layer and the resin layer. An upper line layer(8) is formed on the lower line layer and a part of the resin layer. The upper line layer has a Ti layer(8a) connected to the lower line layer and an Au layer(8b) through an opening(5,7). A SiN layer(9) is formed on the upper line layer and the resin layer.</p>
申请公布号 KR20130039664(A) 申请公布日期 2013.04.22
申请号 KR20120102039 申请日期 2012.09.14
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 HISAKA TAKAYUKI;NAKAMOTO TAKAHIRO;SHIGA TOSHIHIKO;NISHIZAWA KOICHIRO
分类号 H01L21/28 主分类号 H01L21/28
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