发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which efficiently removes deposits adhered to a surface of a substrate. <P>SOLUTION: In a semiconductor processing apparatus, nitrogen gas cooled to a temperature lower than 0&deg;C is supplied around outer periphery of a lower surface of an ice body 532 which is in a state in which the ice body 532 is close to a surface Wf of a substrate W through a liquid film LF of DIW, and the DIW sandwiched between the surface Wf of the substrate W and the ice body 532 freezes to form a frozen region FR. As a result, in the frozen region FR, an adhesive force of deposits such as particles PT on the surface Wf of the substrate W is weakened by volume expansion of DIW due to ice formation, and the deposits are taken into the frozen region FR. By moving a freezing head 53 against the substrate W, the frozen region FR is released from the surface Wf of the substrate W, with the particles PT removed as well from the surface Wf of the substrate W together with the frozen region. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074232(A) 申请公布日期 2013.04.22
申请号 JP20110213937 申请日期 2011.09.29
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 MIYAMOTO YASUHARU;MIYA KATSUHIKO
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址
您可能感兴趣的专利