发明名称 CURRENT PROBE, CURRENT PROBE MEASUREMENT SYSTEM AND CURRENT PROBE MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a current probe to reduce a measurement error caused by the influence of unnecessary magnetic field which is generated from an object not to be measured adjacent to an object to be measured in a current measurement. <P>SOLUTION: The current probe includes: a sensor for detecting a magnetic field; transmission lines connected to the sensor; and a pair of conductive members arranged so as to face the sensor while projecting to a forward direction from a tip of the sensor. A forward direction of the sensor, which is surrounded by the projected part of the conductive member, is opened in the surface direction of facing the conductive member. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013072822(A) 申请公布日期 2013.04.22
申请号 JP20110213708 申请日期 2011.09.29
申请人 HITACHI LTD 发明人 FUNATO HIROKI;SUGA MASARU
分类号 G01R29/08 主分类号 G01R29/08
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