发明名称 SLURRY FOR CMP AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a slurry for a CMP capable of polishing a silicon oxide film at practical speed without substantially polishing a CMP stopper film in a lower layer without generating a defect. <P>SOLUTION: A slurry for a CMP in an embodiment contains: colloidal silica blended with 0.5 mass% or more and 3 mass% or less of the total amount; and polycarboxylic acid whose weight average molecular weight is 500 or more and 10,000 or less, blended with 0.1 mass% or more and 1 mass% or less of the total amount, and pH is 2.5 or more and 4.5 or less. Particles with 50 mass% or more and 90 mass% or less of the whole colloidal silica have primary particle diameters of 3 nm or more and 10 nm or less. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074036(A) 申请公布日期 2013.04.22
申请号 JP20110211001 申请日期 2011.09.27
申请人 TOSHIBA CORP 发明人 MINAMI FUKUGAKU;KAWASE AKIFUMI;MATSUI YUKITERU;EDA HAJIME
分类号 H01L21/304;B24B37/00 主分类号 H01L21/304
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