DEFECT DETECTION METHOD

摘要

PROBLEM TO BE SOLVED: To detect a minute defect included in a fabric image with complicated formation having a structure in which a specific fabric pattern is repeated like tiles.

SOLUTION: A method for detecting defects included in fabric to be detected includes: an image acquisition step S10 of acquiring a fabric image; a reference image generation step S20 of generating a reference image including a normal pattern for comparison based on the acquisition image acquired in the image acquisition step S10; an image transformation step S30 of applying wavelet transformation to both of the reference image generated in the reference image generation step S20 and the acquisition image acquired in the image acquisition step S10; an image comparison step S40 of comparing the reference image with the acquisition image after the wavelet transformation by the image transformation step S30.

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