发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having dielectric strength voltage and capable of achieving normally-off without increasing on-resistance. <P>SOLUTION: A semiconductor device comprises: a first semiconductor layer 13 formed on a substrate 11; a second semiconductor layer 14 formed on the first semiconductor layer; a third semiconductor layer 15 formed on the second semiconductor layer; a gate electrode 21 formed on the third semiconductor layer; and a source electrode 22 and a drain electrode 23 formed in contact with the second semiconductor layer. In the third semiconductor layer, a semiconductor material is doped with a p-type impurity element. The third semiconductor layer has a region protruding from an end of the gate electrode to the side on which the drain electrode is provided. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074070(A) 申请公布日期 2013.04.22
申请号 JP20110211562 申请日期 2011.09.27
申请人 FUJITSU LTD 发明人 KOTANI JUNJI
分类号 H01L21/338;H01L21/28;H01L21/336;H01L21/8232;H01L27/06;H01L29/423;H01L29/49;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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