发明名称 |
PROBE CARD PARTITION SCHEME |
摘要 |
A method of probe card partitioning for testing an integrated circuit die includes providing a first probe card partition layout having a first number of distinct sections. Each distinct section uses a distinct probe card for testing. The first probe card partition layout is repartitioned into a second probe card partition layout having a second number of distinct sections. The second number is less than the first number.
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申请公布号 |
US2013093452(A1) |
申请公布日期 |
2013.04.18 |
申请号 |
US201113273633 |
申请日期 |
2011.10.14 |
申请人 |
GOEL SANDEEP KUMAR;WANG MILL-JER;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
GOEL SANDEEP KUMAR;WANG MILL-JER |
分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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