发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 A method for fabricating a semiconductor device, includes forming a dielectric film above a substrate; forming an opening in the dielectric film; forming a first film containing a metal whose energy for forming silicide thereof is lower than that of Cu silicide inside the opening; forming a second film that is conductive and contains copper (Cu) in the opening in which the first film containing the metal is formed; and forming a compound film containing Cu and silicon (Si) selectively on the second film in an atmosphere in which a temperature of the substrate is below 300° C.
申请公布号 US2013093090(A1) 申请公布日期 2013.04.18
申请号 US201213707359 申请日期 2012.12.06
申请人 HAYASHI YUMI;SAKATA ATSUKO;WATANABE KEI;MATSUNAGA NORIAKI;NAKAO SHINICHI;WADA MAKOTO;TOYODA HIROSHI 发明人 HAYASHI YUMI;SAKATA ATSUKO;WATANABE KEI;MATSUNAGA NORIAKI;NAKAO SHINICHI;WADA MAKOTO;TOYODA HIROSHI
分类号 H01L23/485 主分类号 H01L23/485
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