Verfahren zum schnellen Messen von Proben mit geringem optischen Wegunterschied mittels elektromagnetischer Strahlung im Terahertz-Bereich,申请号DE20071011820-传众专利搜索

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发明名称	Verfahren zum schnellen Messen von Proben mit geringem optischen Wegunterschied mittels elektromagnetischer Strahlung im Terahertz-Bereich
摘要
申请公布号	DE102007011820(B4)	申请公布日期	2013.04.18
申请号	DE20071011820	申请日期	2007.03.12
申请人	FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V.;FRIEDRICH-SCHILLER-UNIVERSITAET JENA	发明人	PRADARUTTI, BORIS;RIEHEMANN, STEFAN, DR.;NOTNI, GUNTHER, DR.
分类号	G03B42/00;G01N21/35	主分类号	G03B42/00
代理机构		代理人
主权项
地址

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