发明名称 MEMORY CELL STRUCTURES
摘要 The present disclosure includes memory cell structures and method of forming the same. One such memory cell includes a first electrode having sidewalls angled less than 90 degrees in relation to a bottom surface of the first electrode, a second electrode, including an electrode contact portion of the second electrode, having sidewalls angled less than 90 degrees in relation to the bottom surface of the first electrode, wherein the second electrode is over the first electrode, and a storage element between the first electrode and the electrode contact portion of the second electrode.
申请公布号 WO2013006363(A3) 申请公布日期 2013.04.18
申请号 WO2012US44581 申请日期 2012.06.28
申请人 MICRON TECHNOLOGY, INC.;SILLS, SCOTT E. 发明人 SILLS, SCOTT E.
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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