发明名称 CONTACT AND PROBE USING SAME
摘要 Provided are: a contact, which does not have processing strain generated therein even if the contact is long and thin, and has long service life and low manufacture cost; and a probe using the contact. A bellows body (20), a fixed section (30) connected to one end portion (21) of the bellows body (20), and a movable section (40) connected to the other end portion (22) of the bellows body (20) are integrally formed by means of an electroforming method. Then, adjacent circular portions (24, 24) of the bellows body (20) are short-circuited by being in contact with each other when the bellows body (20) is compressed by pressing the movable section (40).
申请公布号 WO2013054558(A1) 申请公布日期 2013.04.18
申请号 WO2012JP56658 申请日期 2012.03.15
申请人 OMRON CORPORATION;SAKAI, TAKAHIRO;HEMMI, YOSHINOBU 发明人 SAKAI, TAKAHIRO;HEMMI, YOSHINOBU
分类号 H01R13/24;H01R33/76 主分类号 H01R13/24
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