发明名称 |
ACTINIC RAY SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE AND ELECTRONIC DEVICE USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a hole pattern having an ultrafine pore diameter, excellent in circularity while maintaining excellent dependence on development time. <P>SOLUTION: There is provided an actinic ray sensitive or radiation sensitive resin composition including: (P) a resin having a repeating unit (a) represented by the following general formula (I); (B) a compound that generates an organic acid by irradiation with an actinic ray or radiation; and (C) a basic compound or an ammonium salt compound that decreases basicity by irradiation with the actinic ray or radiation. A molar ratio [C]/[B] of the compound (C) to the compound (B) is 0.4 or more. A resist film, a pattern forming method, a method for manufacturing an electronic device and an electronic device using the same are also provided. In the general formula (I), R<SB POS="POST">0</SB>represents a hydrogen atom or a methyl group. R<SB POS="POST">1</SB>, R<SB POS="POST">2</SB>and R<SB POS="POST">3</SB>each independently represent a linear or branched alkyl group. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013068779(A) |
申请公布日期 |
2013.04.18 |
申请号 |
JP20110207019 |
申请日期 |
2011.09.22 |
申请人 |
FUJIFILM CORP |
发明人 |
YAMAMOTO KEI;KOSHIJIMA KOSUKE;TAKAHASHI HIDETOMO;YAMAGUCHI SHUHEI;SHIRAKAWA MICHIHIRO |
分类号 |
G03F7/039;C08F2/50;C08F20/18;G03F7/004;G03F7/038;G03F7/32;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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