发明名称 OMNIDIRECTIONAL SUPER-RESOLUTION MICROSCOPY
摘要 A microscopy method and apparatus includes placing a specimen to be observed adjacent to a reflective holographic optical element (RDOE). A beam of light that is at least partially coherent is focused on a region of the specimen. The beam forward propagates through the specimen and is at least partially reflected backward through the specimen. The backward reflected light interferes with the forward propagating light to provide a three dimensional interference pattern that is at least partially within the specimen. A specimen region illuminated by the interference pattern is imaged at an image detector. Computational reconstruction is used to generate a microscopic image in all three spatial dimensions (X,Y,Z), simultaneously with resolution greater than conventional microscopy.
申请公布号 US2013093871(A1) 申请公布日期 2013.04.18
申请号 US201113276206 申请日期 2011.10.18
申请人 NOWATZYK ANDREAS G.;FARKAS DANIEL 发明人 NOWATZYK ANDREAS G.;FARKAS DANIEL
分类号 G02B21/06;H04N7/18 主分类号 G02B21/06
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