| 摘要 |
PURPOSE: A tester socket for semiconductors is provided to improve power integrity(PI) properties, thereby preventing possible problems due to low PI properties under high frequency circumstances. CONSTITUTION: A tester socket for semiconductors comprises an upper test socket(10), a lower test socket(20), and a test socket PCB(Printed Circuit Board)(30). The upper test socket contacts with a semiconductor device to be tested. The lower test socket contacts with the test socket PCB. The test socket PCB is mounted between the upper test socket and the lower test socket for forming a plurality of vias to electrically connect the upper test socket and the lower test socket. |
