发明名称 SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device which can appropriately silicide word lines or gate electrodes in both of a memory cell array and peripheral circuits. <P>SOLUTION: A semiconductor storage device comprises: a semiconductor substrate; a plurality of memory cells each including a floating gate provided above the semiconductor substrate, an inter-gate insulation film provided on the floating gate and a control gate provided on the inter-gate insulation film; and a peripheral circuit including a transistor having gate electrodes including a floating gate and a control gate electrically connected with each other, side wall films covering side faces of the floating gate of the gate electrode, and spacers covering side faces of the control gate of the gate electrode and provided on the side wall films. In the memory cell and the peripheral circuit, an upper part of the control gate is silicided. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013069993(A) 申请公布日期 2013.04.18
申请号 JP20110209204 申请日期 2011.09.26
申请人 TOSHIBA CORP 发明人 HATTORI MASANARI
分类号 H01L21/8247;H01L21/336;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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