Method for measuring force gradient at e.g. scanning force microscopy, involves attaching spacer at end of magnetic material filled nanotube

摘要

The method involves performing the bending vibration of the cantilever of a force microscope at the position of a vibration node. A spacer is attached at the end of a magnetic material filled nanotube. The force gradient is individually or sequentially measured at the position of the sample in the horizontal and vertical directions. An independent claim is included for device for measuring force gradient at scanning force microscopy.