发明名称 |
SAMPLE ANALYSIS DEVICE AND SAMPLE ANALYSIS METHOD |
摘要 |
This invention provides a sample analyzing device and sample analyzing method designed to suppress nonuniform capture of magnetic particles (10) and detect a desired substance with higher accuracy. The sample analyzing device includes a flow channel (15) that conducts thereinto a sample which contains the magnetic particles (10), and magnetic field generating means (12) that generates magnetic fields for capturing the magnetic particles (10) in a magnetic particles capturing region of the flow channel (15); wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particles capturing region, is larger than a cross-sectional area of the flow channel, at an upstream end of the magnetic particles capturing region, and that the magnetic fields generated by the magnetic field generating means (12) have a greater magnitude at a downstream side of the magnetic particles capturing region than at an upstream side thereof. |
申请公布号 |
EP2581746(A1) |
申请公布日期 |
2013.04.17 |
申请号 |
EP20110792446 |
申请日期 |
2011.06.07 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
INABA TORU;MATSUOKA SHINYA;SAKAZUME TAKU;YAMASHITA YOSHIHIRO;SHIMADA MASAFUMI;KOGI OSAMU;HARADA YUSHI |
分类号 |
G01N35/00;B03C1/00;G01N33/543;G01N35/08 |
主分类号 |
G01N35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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