发明名称 SAMPLE ANALYSIS DEVICE AND SAMPLE ANALYSIS METHOD
摘要 This invention provides a sample analyzing device and sample analyzing method designed to suppress nonuniform capture of magnetic particles (10) and detect a desired substance with higher accuracy. The sample analyzing device includes a flow channel (15) that conducts thereinto a sample which contains the magnetic particles (10), and magnetic field generating means (12) that generates magnetic fields for capturing the magnetic particles (10) in a magnetic particles capturing region of the flow channel (15); wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particles capturing region, is larger than a cross-sectional area of the flow channel, at an upstream end of the magnetic particles capturing region, and that the magnetic fields generated by the magnetic field generating means (12) have a greater magnitude at a downstream side of the magnetic particles capturing region than at an upstream side thereof.
申请公布号 EP2581746(A1) 申请公布日期 2013.04.17
申请号 EP20110792446 申请日期 2011.06.07
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 INABA TORU;MATSUOKA SHINYA;SAKAZUME TAKU;YAMASHITA YOSHIHIRO;SHIMADA MASAFUMI;KOGI OSAMU;HARADA YUSHI
分类号 G01N35/00;B03C1/00;G01N33/543;G01N35/08 主分类号 G01N35/00
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