发明名称 Dielectric structures
摘要 A capacitor structure and method of forming it are described. In particular, a high-K dielectric oxide is provided as the capacitor dielectric. The high-K dielectric is deposited in a series of thin layers and oxidized in a series of oxidation steps, as opposed to a depositing a single thick layer. Further, at least one of the oxidation steps is less aggressive than the oxidation environment or environments that would be used to deposit the single thick layer. This allows greater control over oxidizing the dielectric and other components beyond the dielectric.
申请公布号 US8421140(B2) 申请公布日期 2013.04.16
申请号 US20030613203 申请日期 2003.07.03
申请人 SANDHU GURTEJ S.;BLALOCK GUY T.;MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;BLALOCK GUY T.
分类号 H01L21/02;H01L21/316;H01L21/8242;H01L27/108;H01L29/76 主分类号 H01L21/02
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