发明名称 Circuit test apparatus
摘要 A circuit testing apparatus for testing a device under test is disclosed. The device under test includes a first terminal end and second terminal end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines whether the device under test has passed the test according to the first and second output signals.
申请公布号 US8421474(B2) 申请公布日期 2013.04.16
申请号 US20080244319 申请日期 2008.10.02
申请人 TENG CHENG-YUNG;CHANG LI-YING;PRINCETON TECHNOLOGY CORPORATION 发明人 TENG CHENG-YUNG;CHANG LI-YING
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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