发明名称 |
Digital waveform generation and measurement in automated test equipment |
摘要 |
A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic. |
申请公布号 |
US8423315(B2) |
申请公布日期 |
2013.04.16 |
申请号 |
US20100660800 |
申请日期 |
2010.03.03 |
申请人 |
KAPPAUF WILLIAM F.;BLANCHA BARRY EDWARD;NAKAO TETSURO;BINI ATE, LLC |
发明人 |
KAPPAUF WILLIAM F.;BLANCHA BARRY EDWARD;NAKAO TETSURO |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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