发明名称 |
Near-field optical microscope, near-field optical probe, and sample observation method |
摘要 |
Provided is a scanning near-field optical microscope capable of obtaining, in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.
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申请公布号 |
US8424111(B2) |
申请公布日期 |
2013.04.16 |
申请号 |
US201113167172 |
申请日期 |
2011.06.23 |
申请人 |
KARAKI KOICHI;NISHIOKA KIMIHIKO;SASAKI YASUO;TSUKAGOSHI TAKUYA;AJIKI YOSHIHARU;SHIMOYAMA ISAO;MATSUMOTO KIYOSHI;KAN TETSURO;TAKEI YUSUKE;NODA KENTARO;OLYMPUS CORPORATION;THE UNIVERSITY OF TOKYO |
发明人 |
KARAKI KOICHI;NISHIOKA KIMIHIKO;SASAKI YASUO;TSUKAGOSHI TAKUYA;AJIKI YOSHIHARU;SHIMOYAMA ISAO;MATSUMOTO KIYOSHI;KAN TETSURO;TAKEI YUSUKE;NODA KENTARO |
分类号 |
G01Q60/22 |
主分类号 |
G01Q60/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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