发明名称 Method and apparatus for generating periodic patterns by step-and-align interference lithography
摘要 The present invention provides a method and an apparatus for generating periodic patterns by step-and-align interference lithography, wherein at least two coherent light beams with a pattern are controlled to project onto a substrate to be exposed to form an interference-patterned region on the substrate. Thereafter, by means of moving the substrate or the light beams stepwisely, a patterned region with a large area can be formed on the substrate. According to the present invention, the optical path and exposure time may be shortened to reduce defect formation during lithographic processing and to improve the yield.
申请公布号 US8420305(B2) 申请公布日期 2013.04.16
申请号 US20100774556 申请日期 2010.05.05
申请人 WANG LON;CHEN YUNG-PIN;JAO CHIH-SHENG;CHANG SHUO-HUNG;CHANG JER-HAUR;INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 WANG LON;CHEN YUNG-PIN;JAO CHIH-SHENG;CHANG SHUO-HUNG;CHANG JER-HAUR
分类号 G03C5/06 主分类号 G03C5/06
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