发明名称 EDGE TERMINATION STRUCTURE FOR POWER SEMICONDUCTOR DEVICES
摘要 <p>PURPOSE: An edge termination structure for a power semiconductor device is provided to reduce the inactive part of the termination region for a power semiconductor device. CONSTITUTION: An epitaxial layer(110) is formed on a semiconductor substrate(105). An active trench(120) is formed in the epitaxial layer. A mask(115) is formed on the upper surface of the epitaxial layer. A peripheral trench(122) includes a dielectric material, an insulating material, a semi-insulating material, a conductive material or their combination. The peripheral trench and the active trench are formed at the same time. A sidewall dopant region(125) is formed in the epitaxial layer adjacent to the sidewall of the active trench. [Reference numerals] (110) Epi;</p>
申请公布号 KR20130037655(A) 申请公布日期 2013.04.16
申请号 KR20120110802 申请日期 2012.10.05
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 KIM SUKU;YEDINAK JOSEPH ANDREW;HO IHSIU
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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