发明名称 Non-volatile memory with active ionic interface region
摘要 An example memory cell may have at least a tunneling region disposed between a conducting region and a metal region, wherein the tunneling region can have at least an active interface region disposed between a first tunneling barrier and a second tunneling barrier. A high resistive film is formed in the interface region with migration of ions from both the metal and conducting regions responsive to a write current to program the memory cell to a selected resistive state.
申请公布号 US8421048(B2) 申请公布日期 2013.04.16
申请号 US20090501689 申请日期 2009.07.13
申请人 VAITHYANATHAN VENUGOPALAN;SIEGERT MARKUS JAN PETER;TIAN WEI;BALAKRISHNAN MURALIKRISHNAN;JIN INSIK;SEAGATE TECHNOLOGY LLC 发明人 VAITHYANATHAN VENUGOPALAN;SIEGERT MARKUS JAN PETER;TIAN WEI;BALAKRISHNAN MURALIKRISHNAN;JIN INSIK
分类号 H01L29/02;H01L45/00 主分类号 H01L29/02
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