发明名称 Semiconductor device and fabrication thereof
摘要 A method for forming a semiconductor device is disclosed. A substrate including a gate dielectric layer and a gate electrode layer sequentially formed thereon is provided. An offset spacer is formed on sidewalls of the gate dielectric layer and the gate electrode layer. A carbon spacer is formed on a sidewall of the offset spacer, and the carbon spacer is then removed. The substrate is implanted to form a lightly doped region using the gate electrode layer and the offset spacer as a mask. The method may also include providing a substrate having a gate dielectric layer and a gate electrode layer sequentially formed thereon. A liner layer is formed on sidewalls of the gate electrode layer and on the substrate. A carbon spacer is formed on a portion of the liner layer adjacent the sidewall of the gate electrode layer. A main spacer is formed on a sidewall of the carbon spacer. The carbon spacer is removed to form an opening between the liner layer and the main spacer. The opening is sealed by a sealing layer to form an air gap.
申请公布号 US8421166(B2) 申请公布日期 2013.04.16
申请号 US201113175443 申请日期 2011.07.01
申请人 CHI MIN-HWA;CHIANG WEN-CHUAN;CHIANG MU-CHI;CHEN CHENG-KU;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHI MIN-HWA;CHIANG WEN-CHUAN;CHIANG MU-CHI;CHEN CHENG-KU
分类号 H01L21/02;H01L21/76;H01L27/118 主分类号 H01L21/02
代理机构 代理人
主权项
地址