发明名称 Methods of reading data in a NAND flash memory device with a fringe voltage applied to a conductive layer
摘要 Methods of programming data in a non-volatile memory cell are provided. A memory cell according to some embodiments may include a gate structure that includes a tunnel oxide layer pattern, a floating gate, a dielectric layer and a control gate sequentially stacked on a substrate, impurity regions that are formed in the substrate at both sides of the gate structure, and a conductive layer pattern that is arranged spaced apart from and facing the floating gate. Embodiments of such methods may include applying a programming voltage to the control gate, grounding the impurity regions and applying a fringe voltage to the conductive layer pattern to generate a fringe field in the floating gate.
申请公布号 US8422290(B2) 申请公布日期 2013.04.16
申请号 US201113072022 申请日期 2011.03.25
申请人 KANG HEE-SOO;LEE CHOONG-HO;CHOI DONG-UK;SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG HEE-SOO;LEE CHOONG-HO;CHOI DONG-UK
分类号 G11C16/04 主分类号 G11C16/04
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