发明名称 Semiconductor device and connection checking method for semiconductor device
摘要 Provided is a semiconductor device in which a connection between connection terminals and land of the semiconductor device can be checked with the semiconductor device kept in a sound condition, the connection not being allowed to be checked with a semiconductor chip. The semiconductor device of the present invention includes: a package substrate; a semiconductor chip mounted on the package substrate; a first land formed in a first principal surface of the package substrate; a second land formed in a second principal surface of the package substrate; first connection terminals connected to the second land and having the connection thereto not allowed to be checked with the semiconductor chip; a connection interconnection for connecting the first land and the second land; a second connection terminal formed in the second principal surface of the package substrate; and a branch interconnection for connecting the connection interconnection and the second connection terminal.
申请公布号 US8421206(B2) 申请公布日期 2013.04.16
申请号 US20090591424 申请日期 2009.11.19
申请人 AKIYAMA NAOTO;UMESHIMA TOSHIAKI;RENESAS ELECTRONICS CORPORATION 发明人 AKIYAMA NAOTO;UMESHIMA TOSHIAKI
分类号 H01L23/48 主分类号 H01L23/48
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