发明名称 Method for forming buried cavities within a semiconductor body, and semiconductor body thus made
摘要 A method for the formation of buried cavities within a semiconductor body envisages the steps of: providing a wafer having a bulk region made of semiconductor material; digging, in the bulk region, trenches delimiting between them walls of semiconductor material; forming a closing layer for closing the trenches in the presence of a deoxidizing atmosphere so as to englobe the deoxidizing atmosphere within the trenches; and carrying out a thermal treatment such as to cause migration of the semiconductor material of the walls and to form a buried cavity. Furthermore, before the thermal treatment is carried out, a barrier layer that is substantially impermeable to hydrogen is formed on the closing layer on top of the trenches.
申请公布号 US8420428(B2) 申请公布日期 2013.04.16
申请号 US20100873685 申请日期 2010.09.01
申请人 BARLOCCHI GABRIELE;CORONA PIETRO;FARALLI DINO;VILLA FLAVIO FRANCESCO;STMICROELECTRONICS S.R.L. 发明人 BARLOCCHI GABRIELE;CORONA PIETRO;FARALLI DINO;VILLA FLAVIO FRANCESCO
分类号 H01L21/00;H01L21/76 主分类号 H01L21/00
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