发明名称 |
3D STRUCTURED NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A nonvolatile memory device of a three dimensional structure and a manufacturing method thereof are provided to improve a retention property and to increase an erase speed of a memory device by doping a charge trap layer with impurities. CONSTITUTION: A plurality of word lines(21) and a plurality of interlayer dielectric layers(22) are alternatively laminated. A channel(25) passes through a plurality of the word lines and a plurality of the interlayer dielectric layers. A tunnel insulation layer(24) surrounds the channel. A plurality of first charge trap layers(23A) is interposed between the plurality of word lines and the tunnel insulation layer. A plurality of the charge trap layers is doped with impurities. A plurality of second charge trap layers(23B) is interposed between the plurality of interlayer dielectric layers and the tunnel insulation layer. A plurality of charge blocking layers(27) is interposed between a plurality of the word lines and a plurality of the first charge trap layers.</p> |
申请公布号 |
KR20130037063(A) |
申请公布日期 |
2013.04.15 |
申请号 |
KR20110101388 |
申请日期 |
2011.10.05 |
申请人 |
SK HYNIX INC. |
发明人 |
LEE, KI HONG;PYI, SEUNG HO;PARK, IN SU |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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