ELECTRICAL CONTACT UNIT AND PROBE ASSEMBLY FOR ELECTRICAL INSPECTING A DEVICE HAVING THE SAME

摘要

PURPOSE: An electrical contact structure and a probe assembly for electricity test containing the same are provided to be equipped with a contact pattern and a wiring pattern as a single film structure. CONSTITUTION: A probe assembly for electricity test(100) is composed of the following parts: a wiring pattern(35) extended to face the front-end part(11a) of a base block(11); a protective film formed on the wiring pattern facing an electrode pad(21) to protect the wiring pattern; a contact pattern(37) arranged at the lower part of the wiring pattern to be electrically contacted with the electrode pad of a test object(200); and a via pattern(39) penetrating a first protective layer between the wiring pattern and the contact pattern.