发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
摘要 PURPOSE: An apparatus and method for processing a substrate are provided to prevent a developer from being undulated by separately collecting a first processing solution and smoothly substituting the first processing solution for a second processing solution. CONSTITUTION: A first processing solution supply unit supplies a first processing solution to a substrate(G). A gas supply unit(21) supplies a preset gas to the surface of the substrate in which the first processing solution is collected. A second rinse nozzle discharges a second processing solution to the surface of the substrate. A first rinse nozzle(22) discharges the second processing solution to the surface of the substrate to which the gas is supplied. A solution collecting unit(27) forms a solution collected part extended in a width direction of the substrate on a substrate transfer path by the second processing solution supplied by the first rinse nozzle.
申请公布号 KR20130036700(A) 申请公布日期 2013.04.12
申请号 KR20120080534 申请日期 2012.07.24
申请人 TOKYO ELECTRON LIMITED 发明人 KUBO MAKOTO;SADA TETSUYA;NAGATA ATSUSHI;NISHIMURA SATOSHI;FUJIWARA MASAKI
分类号 H01L21/302 主分类号 H01L21/302
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