发明名称 |
A FINFET DEVICE AND METHOD OF MANUFACTURING SAME |
摘要 |
PURPOSE: A FinFET device and a manufacturing method thereof are provided to improve carrier mobility in a current direction of a channel region by including a source and drain feature unit with a large area which is not disconnected. CONSTITUTION: A fin structure with one or more fins is formed on a substrate(104). An insulation material is deposited on the fin structure(106). A part of the insulation material is removed to expose a part of each fin in the fin structure(108). A gate structure is formed on the exposed part of each fin in the fin structure(110). The gate structure separates a source region from a drain region of a semiconductor device. The insulation material is removed from the source and drain regions(112). A source and drain feature unit is formed on the source and drain regions(114). [Reference numerals] (102) Providing a substrate; (104) Forming a fin structure on the substrate; (106) Depositing an insulation material on the fin structure; (108) Etching a part of the insulation material to expose a part of the fin structure; (110) Forming a gate structure on the fin structure; (112) Etching the insulation material in a source and drain region; (114) Forming a semiconductor material in the source and drain region; (116) Completing fabrication; |
申请公布号 |
KR20130036694(A) |
申请公布日期 |
2013.04.12 |
申请号 |
KR20120004950 |
申请日期 |
2012.01.16 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIU CHI WEN;WANG CHAO HSIUNG |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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