| 摘要 |
PURPOSE: A matrix switching device and a test system for a semiconductor component using the same are provided to control the opening/closing operation of the matrix switching device using a sensor and a control unit. CONSTITUTION: A switching matrix(30) includes M column terminals and N row terminals, and M and N are equal to or greater than integer 1. Column terminals from 1 to M are respectively connected to a column line(32) corresponding to each terminal, and row terminals from 1 to N are respectively connected to a row line(34) corresponding with each terminal. Two connection points connected between the column line and the row line include a switching member(36) arranged in a matrix mode. A control unit(18) is used to control the opening/closing state of the switching member according to the switching command of the processing unit(28). An electric sensor assembly(38) generates a signal by measuring the predetermined electrical characteristic of an electrical path.
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