| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve such problems that a test time for three ROMs is only able to shorten to the test time for two ROMs, or there are a possibility of fluctuation in the number of data bits on account of an adding or a subtracting operation and also a possibility of decline of reliability. <P>SOLUTION: In the method of shortening the ROM test time when data written into a plurality of ROMs are tested, comparison means is provided for comparing output data of ROMs two by two for every bit in the plural ROMs, and output of the comparison means is stored respectively to correspond to the plural ROMs, and with respect to output data of plural storage means, arithmetic operations of at least two different contents with different arithmetical order are executed to inspect the ROM data by means of comparing the arithmetic results with anticipated values. <P>COPYRIGHT: (C)2013,JPO&INPIT |
