| 摘要 |
<p>A device for assisting in operation verification (100) which assists in operation verification performed by a measurer of an electronic circuit mounted on a substrate, wherein provided are: a waveform-acquiring unit (107) for acquiring an observed waveform that is a signal waveform of a voltage or an electric current and is measured by the measurer bringing a probe into contact with the substrate; a degree-of-similarity-calculating unit (108) for calculating the degree of similarity between the observation waveform acquired by the waveform-acquiring unit (107), and each of a plurality of simulated signal waveforms that are signal waveforms of the voltage or electric current in the plurality of nodes on the electronic circuit obtained by simulating movement of the electronic circuit; a position-specifying unit (111) for specifying the position of the nodes on the electronic circuit corresponding to the simulated signal waveforms in which the degree of similarity calculated by the degree-of similarity-calculating unit (108) is a maximum, on the basis of the node information indicating the position of the nodes on the electronic circuit corresponding to each of the plurality of simulated signal waves; and a notification unit (110) for notifying the measurer of the position of the nodes on the electronic circuit specified by the position-specifying unit (111).</p> |
