发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To increase a threshold voltage while decreasing on-resistance in a transistor using a nitride semiconductor layer as a channel. <P>SOLUTION: Compression strain is generated at a boundary surface between a cap layer 400 and a barrier layer 300, and at a boundary surface between a channel layer 200 and a buffer layer 100. Stretching strain is generated at a boundary surface between the barrier layer 300 and the channel layer 200. Because of this, the number of negative charges is larger than the number of positive charges at the boundary surface between the cap layer 400 and the barrier layer 300, and at the boundary surface between the channel layer 200 and the buffer layer 100. And the number of the positive charges is larger than the number of the negative charges at the boundary surface between the barrier layer 300 and the channel layer 200. The channel layer 200 includes a lamination structure having a first layer, a second layer and a third layer. The second layer has electron affinity larger than that of each of the first layer and the third layer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013065649(A) 申请公布日期 2013.04.11
申请号 JP20110202739 申请日期 2011.09.16
申请人 RENESAS ELECTRONICS CORP 发明人 INOUE TAKASHI;NAKAYAMA TATSUO;OKAMOTO YASUHIRO;MIYAMOTO HIRONOBU
分类号 H01L21/338;H01L21/336;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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