| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a plate glass examination apparatus in which, when examining a glass defect that occurs continuously, an examination speed is accelerated while securing required examination precision and further apparatus costs are suppressed without complicating an apparatus configuration. <P>SOLUTION: A plate glass examination apparatus is provided which examines a plurality of pieces of plate glass. The plate glass examination apparatus comprises a detection section 110 and a determination section 120. The detection section detects a defect candidate range of first plate glass and a defect candidate range of second plate glass which is different from the first plate glass. The determination section 120 compares a position of the defect candidate range of the first plate glass to a position of the defect candidate range of the second plate glass and determines the presence/absence of a defect which is continued over the first plate glass and the second plate glass, on the basis of a result of the comparison. <P>COPYRIGHT: (C)2013,JPO&INPIT |
