发明名称 SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device which can increase a coupling capacity ratio among a control gate and floating gates even when an element thereof is miniaturized, and further to provide a manufacturing method thereof. <P>SOLUTION: A semiconductor storage device is provided with a semiconductor substrate. First insulation films are formed on the semiconductor substrate. Each of floating gates includes a first floating gate part provided on the first insulation film, an intermediate insulation film provided on the first floating gate part and a second floating gate part provided on the intermediate insulation film and is configured so as to be able to accumulate charge. Second insulation films are provided on top faces and lateral faces of the floating gates. A control gate faces the top faces and the lateral faces of the floating gates via the second insulation films and controls voltages of the floating gates. On the lateral faces of the floating gates, the intermediate insulation films are recessed with respect to the first and second floating gate parts. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013065799(A) 申请公布日期 2013.04.11
申请号 JP20110204910 申请日期 2011.09.20
申请人 TOSHIBA CORP 发明人 KOTO TAKAHIRO;KAJIMOTO SANETOSHI;TAKEKIDA HIDEHITO
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/336
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