发明名称 PROBE UNIT
摘要 Provided is a probe unit capable of reliably obtaining conduction with a contact target even for large currents. This probe unit is provided with: contact probes comprising a plunger that has a contact part which contacts an electrode of the body to be contacted, a flange part which extends from the base side of the contact part and has a diameter larger than that of the contact part, a boss part which extends from the end of the flange part on the side other than the side connected to the contact part and which has a diameter smaller than that of the flange part, and a base part which extends from the end of the boss part on the side other than the side connected to the flange part and which has approximately the same diameter as that of the boss unit, said contact probes further comprising a coil spring which is attached to the boss part; and a probe holder which is formed from a conductive material, which has a stepped shape with a reduced diameter in at both ends in the thickness direction, and which has multiple holder holes which accommodate the contact probes. The plunger is biased by the flange part contacting one of the steps of the stepped shape and the coil spring contacting the other step.
申请公布号 WO2013051675(A1) 申请公布日期 2013.04.11
申请号 WO2012JP75862 申请日期 2012.10.04
申请人 NHK SPRING CO., LTD. 发明人 MATSUI, AKIHIRO;MORI, TAKASHI
分类号 G01R1/067;G01R1/073;H01L21/66 主分类号 G01R1/067
代理机构 代理人
主权项
地址